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X-Ray Spectrometry : Recent Technological Advances

By: Jasna Injuk (Edited by) , Kouichi Tsuji (Edited by) , Rene Van Grieken (Edited by)

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Ksh 96,900.00

Format: Hardback or Cased Book

ISBN-10: 047148640X

ISBN-13: 9780471486404

Publisher: John Wiley & Sons Inc

Imprint: John Wiley & Sons Inc

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Mar 12th, 2004

Publication Status: Active

Product extent: 624 Pages

Weight: 1474.00 grams

Dimensions (height x width x thickness): 22.90 x 15.20 x 3.90 cms

Product Classification / Subject(s): Spectrum analysis, spectrochemistry, mass spectrometry

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Covers the developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. This title includes the advanced and high-tech aspects of the chemical analysis techniques based on x-rays. It introduces various types of X-ray optics and X-ray detectors, covering history, principles, characteristics and trends.

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