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VLSI Design and Test : 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers (Communications in Computer and Information Science)

By: Ambika Prasad Shah (Edited by) , Anand Darji (Edited by) , Jaynarayan Tudu (Edited by) , Sudeb Dasgupta (Edited by)

Extended Catalogue

Ksh 20,500.00

Format: Paperback or Softback

ISBN-10: 3031215133

ISBN-13: 9783031215131

Collection / Series: Communications in Computer and Information Science

Collection Type: Publisher collection

Edition statement: 1st ed. 2022

Publisher: Springer International Publishing AG

Imprint: Springer International Publishing AG

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Dec 17th, 2022

Publication Status: Active

Product extent: 596 Pages

Product Classification / Subject(s): Circuits & components
Computer hardware

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This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions.
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.

The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

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