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Si Detectors and Characterization for HEP and Photon Science Experiment : How to Design Detectors by TCAD Simulation

By: Ajay Kumar Srivastava (Author)

Extended Catalogue

Ksh 18,250.00

Format: Paperback or Softback

ISBN-10: 3030195333

ISBN-13: 9783030195335

Edition statement: 2019 ed.

Publisher: Springer Nature Switzerland AG

Imprint: Springer Nature Switzerland AG

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Sep 25th, 2020

Publication Status: Active

Product extent: 183 Pages

Product Classification / Subject(s): Mensuration & systems of measurement
Condensed matter physics (liquid state & solid state physics)
Atomic & molecular physics
Particle & high-energy physics
Testing of materials

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This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD  simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation. Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors. The book is intended for researchers and master’s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL.

This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD  simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.

Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.

The book is intended for researchers and master''s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL.


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