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Reflection High-Energy Electron Diffraction

By: Ayahiko Ichimiya (Author) , Philip I. Cohen (Author)

Manufacture on Demand

Ksh 34,200.00

Format: Hardback or Cased Book

ISBN-10: 0521453739

ISBN-13: 9780521453738

Publisher: Cambridge University Press

Imprint: Cambridge University Press

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Dec 13th, 2004

Publication Status: Active

Product extent: 366 Pages

Weight: 894.00 grams

Dimensions (height x width x thickness): 24.40 x 17.00 x 2.10 cms

Product Classification / Subject(s): Surface chemistry & adsorption
Testing of materials
Semi-conductors & super-conductors

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Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts.

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