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Multi-run Memory Tests for Pattern Sensitive Faults

By: Ireneusz Mrozek (Author)

Extended Catalogue

Ksh 10,250.00

Format: Paperback or Softback

ISBN-10: 3030081982

ISBN-13: 9783030081980

Edition statement: Softcover reprint of the original 1st ed. 2019

Publisher: Springer Nature Switzerland AG

Imprint: Springer Nature Switzerland AG

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Feb 1st, 2019

Publication Status: Active

Product extent: 135 Pages

Product Classification / Subject(s): Electronics engineering
Circuits & components
Computer architecture & logic design

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This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.  The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.

  • Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;
  • Presents practical algorithms for design and implementation of efficient multi-run tests;
  • Demonstrates methods verified by analytical and experimental investigations.

Get Multi-run Memory Tests for Pattern Sensitive Faults by at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by Springer Nature Switzerland AG and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

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