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High-Resolution Electron Microscopy for Materials Science

By: Daisuke Shindo (Author) , Hiraga Kenji (Author)

Extended Catalogue

Ksh 10,250.00

Format: Paperback or Softback

ISBN-10: 4431702342

ISBN-13: 9784431702344

Edition statement: Softcover reprint of the original 1st ed. 1998

Publisher: Springer Verlag, Japan

Imprint: Springer Verlag, Japan

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Sep 1st, 1998

Publication Status: Active

Product extent: 190 Pages

Weight: 516.00 grams

Dimensions (height x width x thickness): 21.00 x 27.90 x 1.60 cms

Product Classification / Subject(s): Microscopy
Materials science

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Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials.
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

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