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Electron Microscopy and Analysis

By: Peter J. Goodhew (Author)

Manufacture on Demand

Ksh 48,150.00

Format: Hardback or Cased Book

ISBN-10: 1138441538

ISBN-13: 9781138441538

Edition Number: 3

Publisher: Taylor & Francis Ltd

Imprint: CRC Press

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Jul 7th, 2017

Publication Status: Active

Product extent: 264 Pages

Weight: 650.00 grams

Product Classification / Subject(s): Materials science

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A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

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