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Atomic Force Microscopy : Fundamental Concepts and Laboratory Investigations

By: Wesley C. Sanders (Author)

Extended Catalogue

Ksh 19,500.00

Format: Paperback or Softback

ISBN-10: 036721864X

ISBN-13: 9780367218645

Publisher: Taylor & Francis Ltd

Imprint: CRC Press

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Oct 22nd, 2019

Publication Status: Active

Product extent: 139 Pages

Weight: 252.00 grams

Dimensions (height x width x thickness): 15.50 x 23.30 x 2.10 cms

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This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.

This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.


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