This book covers development in scanning probe microscopies, electron, ion and photon based spectroscopies, structure imaging, analysis and atomic co-ordination, mechanical evaluation of surfaces, characterisation of polishing damage and creep, and measurement of dielectric, piezoelectric and thermal properties.
This book covers development in scanning probe microscopies, electron, ion and photon based spectroscopies, structure imaging, analysis and atomic co-ordination, mechanical evaluation of surfaces, characterisation of polishing damage and creep, and measurement of dielectric, piezoelectric and thermal properties. Materials featured include refractories, engineering ceramics, glasses, composites and electronic ceramics.
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