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Advanced Mathematical And Computational Tools In Metrology And Testing Xi (Series on Advances in Mathematics for Applied Sciences)

By: Alistair B Forbes (Edited by) , Anna G Chunovkina (Edited by) , Nien Fan Zhang (Edited by) , Sascha Eichstadt (Edited by)

Out of stock

Ksh 36,800.00

Format: Hardback or Cased Book

ISBN-10: 9813274298

ISBN-13: 9789813274297

Collection / Series: Series on Advances in Mathematics for Applied Sciences

Collection Type: Publisher collection

Publisher: World Scientific Publishing Co Pte Ltd

Imprint: World Scientific Publishing Co Pte Ltd

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Dec 14th, 2018

Publication Status: Active

Product extent: 460 Pages

Weight: 788.00 grams

Dimensions (height x width x thickness): 19.40 x 23.70 x 2.50 cms

Product Classification / Subject(s): Scientific standards
Mensuration & systems of measurement

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This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.

This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.

This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.


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