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Aberration Theory in Electron and Ion Optics (Advances in Imaging and Electron Physics)

By: France) Hytch Toulouse Martin (Edited by) , Peter W. Hawkes (Edited by)

Extended Catalogue

Ksh 48,150.00

Format: Hardback or Cased Book

ISBN-10: 0443193207

ISBN-13: 9780443193200

Collection / Series: Advances in Imaging and Electron Physics

Collection Type: Publisher collection

Publisher: Elsevier Science Publishing Co Inc

Imprint: Academic Press Inc

Country of Manufacture: NL

Country of Publication: GB

Publication Date: Jun 6th, 2023

Publication Status: Active

Product extent: 374 Pages

Weight: 724.00 grams

Dimensions (height x width x thickness): 15.90 x 24.10 x 2.50 cms

Product Classification / Subject(s): Mechanical engineering
Electronics engineering
Communications engineering / telecommunications
Signal processing

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Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

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